Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...

Software testing is an essential component in ensuring the reliability and efficiency of modern software systems. In recent years, evolutionary algorithms have emerged as a robust framework for ...